Course unit
Last updated: 04/12/2024
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Course Director(s):
BARNIER Vincent
General Description:
This course takes place in the 1st semester (September-February).
This course covers the principle and applications of the main surface characterization methods used in materials science:
- X-ray Photo-electron Spectroscopy (XPS)
- Auger Electron Spectroscopy (AES)
- Atomic Force Microscopy (AFM)
Key words:
Number of teaching hours
30
Fields of study
Teaching language
English
Intended learning outcomes
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Learning assessment methods
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Written exam:
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Project submission:
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Individual oral exam:
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Group presentation:
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Individual presentation:
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Group practical exercise:
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Individual practical exercise:
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Group report:
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Individual report:
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Programme and content
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